Ghenadie Bodean, Diana Bodean, A. Labunetz
New Schemes for Self-Testing RAM
DATE, 2005.
@inproceedings{DATE-2005-BodeanBL, author = "Ghenadie Bodean and Diana Bodean and A. Labunetz", booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2005.223", isbn = "0-7695-2288-2", pages = "858--859", publisher = "{IEEE Computer Society}", title = "{New Schemes for Self-Testing RAM}", year = 2005, }