Test and reliability challenges in automotive microelectronics
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C. Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner
Test and reliability challenges in automotive microelectronics
DATE, 2006.

DATE 2006
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@inproceedings{DATE-2006-SebekeJHFSG,
	author        = "C. Sebeke and C. Jung and Klaus Harbich and S. Fuchs and J. Schwarz and Peter Göhner",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131630",
	pages         = "547",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{Test and reliability challenges in automotive microelectronics}",
	year          = 2006,
}

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