Josef Haid, Bernd Zimek, Thomas Leutgeb, Thomas Künemund
Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication
DATE, 2008.
@inproceedings{DATE-2008-HaidZLK,
author = "Josef Haid and Bernd Zimek and Thomas Leutgeb and Thomas Künemund",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484911",
isbn = "978-3-9810801-3-1",
pages = "784--787",
publisher = "{IEEE}",
title = "{Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication}",
year = 2008,
}











