Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication
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Josef Haid, Bernd Zimek, Thomas Leutgeb, Thomas Künemund
Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-HaidZLK,
	author        = "Josef Haid and Bernd Zimek and Thomas Leutgeb and Thomas Künemund",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484911",
	isbn          = "978-3-9810801-3-1",
	pages         = "784--787",
	publisher     = "{IEEE}",
	title         = "{Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication}",
	year          = 2008,
}

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