Josef Haid, Bernd Zimek, Thomas Leutgeb, Thomas Künemund
Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication
DATE, 2008.
@inproceedings{DATE-2008-HaidZLK, author = "Josef Haid and Bernd Zimek and Thomas Leutgeb and Thomas Künemund", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484911", isbn = "978-3-9810801-3-1", pages = "784--787", publisher = "{IEEE}", title = "{Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication}", year = 2008, }