Jonathan Young
Capturing and Analyzing IC Design Productivity Metrics
DATE, 2008.
@inproceedings{DATE-2008-Young, author = "Jonathan Young", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484797", isbn = "978-3-9810801-3-1", pages = "936--937", publisher = "{IEEE}", title = "{Capturing and Analyzing IC Design Productivity Metrics}", year = 2008, }