Nathan Kupp, Mustapha Slamani, Yiorgos Makris
Correlating inline data with final test outcomes in analog/RF devices
DATE, 2011.
@inproceedings{DATE-2011-KuppSM,
author = "Nathan Kupp and Mustapha Slamani and Yiorgos Makris",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "812--817",
publisher = "{IEEE}",
title = "{Correlating inline data with final test outcomes in analog/RF devices}",
year = 2011,
}











