Nathan Kupp, Mustapha Slamani, Yiorgos Makris
Correlating inline data with final test outcomes in analog/RF devices
DATE, 2011.
@inproceedings{DATE-2011-KuppSM, author = "Nathan Kupp and Mustapha Slamani and Yiorgos Makris", booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}", isbn = "978-1-61284-208-0", pages = "812--817", publisher = "{IEEE}", title = "{Correlating inline data with final test outcomes in analog/RF devices}", year = 2011, }