Travelled to:2 × France
Collaborated with:Y.Makris M.Slamani K.Huang J.M.C.Jr.
Talks about:correl (2) analog (2) test (2) discontinu (1) spatial (1) outcom (1) effect (1) wafer (1) model (1) level (1)
Person: Nathan Kupp
DBLP: Kupp:Nathan
Contributed to:
20132011Wrote 2 papers:
- DATE-2013-HuangKCM #correlation #modelling #testing
- Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests (KH, NK, JMCJ, YM), pp. 553–558.
- DATE-2011-KuppSM #correlation
- Correlating inline data with final test outcomes in analog/RF devices (NK, MS, YM), pp. 812–817.