Automatic success tree-based reliability analysis for the consideration of transient and permanent faults
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Hananeh Aliee, Michael Glaß, Felix Reimann, Jürgen Teich
Automatic success tree-based reliability analysis for the consideration of transient and permanent faults
DATE, 2013.

DATE 2013
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@inproceedings{DATE-2013-AlieeGRT,
	acmid         = "2485673",
	author        = "Hananeh Aliee and Michael Glaß and Felix Reimann and Jürgen Teich",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1621--1626",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Automatic success tree-based reliability analysis for the consideration of transient and permanent faults}",
	year          = 2013,
}

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