Hananeh Aliee, Michael Glaß, Felix Reimann, Jürgen Teich
Automatic success tree-based reliability analysis for the consideration of transient and permanent faults
DATE, 2013.
@inproceedings{DATE-2013-AlieeGRT, acmid = "2485673", author = "Hananeh Aliee and Michael Glaß and Felix Reimann and Jürgen Teich", booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}", isbn = "978-1-4503-2153-2", pages = "1621--1626", publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}", title = "{Automatic success tree-based reliability analysis for the consideration of transient and permanent faults}", year = 2013, }