Travelled to:
1 × France
Collaborated with:
M.Glaß F.Reimann J.Teich
Talks about:
transient (1) consider (1) success (1) reliabl (1) automat (1) analysi (1) perman (1) fault (1) tree (1) base (1)
Person: Hananeh Aliee
DBLP: Aliee:Hananeh
Contributed to:
Wrote 1 papers:
- DATE-2013-AlieeGRT #analysis #automation #fault #reliability
- Automatic success tree-based reliability analysis for the consideration of transient and permanent faults (HA, MG, FR, JT), pp. 1621–1626.