@inproceedings{DATE-2013-RakossyHTSNO,
	acmid         = "2485421",
	author        = "Zoltán Endre Rákossy and Masayuki Hiromoto and Hiroshi Tsutsui and Takashi Sato and Yukihiro Nakamura and Hiroyuki Ochi",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "535--540",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Hot-swapping architecture with back-biased testing for mitigation of permanent faults in functional unit array}",
	year          = 2013,
}