Yehua Su, Wenjing Rao
Defect-tolerant logic hardening for crossbar-based nanosystems
DATE, 2013.
@inproceedings{DATE-2013-SuR, acmid = "2485713", author = "Yehua Su and Wenjing Rao", booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}", isbn = "978-1-4503-2153-2", pages = "1801--1806", publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}", title = "{Defect-tolerant logic hardening for crossbar-based nanosystems}", year = 2013, }