Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato
ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell
DATE, 2015.
@inproceedings{DATE-2015-AwanoHS,
acmid = "2755877",
author = "Hiromitsu Awano and Masayuki Hiromoto and Takashi Sato",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "549--554",
publisher = "{ACM}",
title = "{ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell}",
year = 2015,
}