PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices
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Fu-Hsin Chen, Ming-Chang Yang, Yuan-Hao Chang, Tei-Wei Kuo
PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices
DATE, 2015.

DATE 2015
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@inproceedings{DATE-2015-ChenYCK,
	acmid         = "2757092",
	author        = "Fu-Hsin Chen and Ming-Chang Yang and Yuan-Hao Chang and Tei-Wei Kuo",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "1209--1212",
	publisher     = "{ACM}",
	title         = "{PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices}",
	year          = 2015,
}

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