Fu-Hsin Chen, Ming-Chang Yang, Yuan-Hao Chang, Tei-Wei Kuo
PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices
DATE, 2015.
@inproceedings{DATE-2015-ChenYCK,
acmid = "2757092",
author = "Fu-Hsin Chen and Ming-Chang Yang and Yuan-Hao Chang and Tei-Wei Kuo",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "1209--1212",
publisher = "{ACM}",
title = "{PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices}",
year = 2015,
}