Travelled to:
1 × France
Collaborated with:
M.Yang Y.Chang T.Kuo
Talks about:
progress (1) overhead (1) migrat (1) minim (1) level (1) flash (1) devic (1) wear (1) nand (1) data (1)
Person: Fu-Hsin Chen
DBLP: Chen:Fu=Hsin
Contributed to:
Wrote 1 papers:
- DATE-2015-ChenYCK #migration #named
- PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices (FHC, MCY, YHC, TWK), pp. 1209–1212.