A method for the estimation of defect detection probability of analog/RF defect-oriented tests
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John Liaperdos, Angela Arapoyanni, Yiorgos Tsiatouhas
A method for the estimation of defect detection probability of analog/RF defect-oriented tests
DATE, 2015.

DATE 2015
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@inproceedings{DATE-2015-LiaperdosAT,
	acmid         = "2757136",
	author        = "John Liaperdos and Angela Arapoyanni and Yiorgos Tsiatouhas",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "1395--1400",
	publisher     = "{ACM}",
	title         = "{A method for the estimation of defect detection probability of analog/RF defect-oriented tests}",
	year          = 2015,
}

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