John Liaperdos, Angela Arapoyanni, Yiorgos Tsiatouhas
A method for the estimation of defect detection probability of analog/RF defect-oriented tests
DATE, 2015.
@inproceedings{DATE-2015-LiaperdosAT, acmid = "2757136", author = "John Liaperdos and Angela Arapoyanni and Yiorgos Tsiatouhas", booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}", isbn = "978-3-9815370-4-8", pages = "1395--1400", publisher = "{ACM}", title = "{A method for the estimation of defect detection probability of analog/RF defect-oriented tests}", year = 2015, }