A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing
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Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-GebregiorgisKOB,
	author        = "Anteneh Gebregiorgis and Saman Kiamehr and Fabian Oboril and Rajendra Bishnoi and Mehdi Baradaran Tahoori",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459305/",
	isbn          = "978-3-9815-3707-9",
	pages         = "205--210",
	publisher     = "{IEEE}",
	title         = "{A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing}",
	year          = 2016,
}


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