Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori
A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing
DATE, 2016.
@inproceedings{DATE-2016-GebregiorgisKOB,
author = "Anteneh Gebregiorgis and Saman Kiamehr and Fabian Oboril and Rajendra Bishnoi and Mehdi Baradaran Tahoori",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459305/",
isbn = "978-3-9815-3707-9",
pages = "205--210",
publisher = "{IEEE}",
title = "{A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing}",
year = 2016,
}