Travelled to:1 × USA
2 × France
2 × Germany
Collaborated with:M.B.Tahoori F.Firouzi S.R.Nassif T.H.Osiecki M.Ebrahimi Y.Hara-Azumi R.Baranowski C.Liu H.Wunderlich
Talks about:age (3) analysi (2) variat (2) induc (2) nbti (2) technolog (1) workload (1) standard (1) instruct (1) incorpor (1)
Person: Saman Kiamehr
DBLP: Kiamehr:Saman
Contributed to:
2015
2014201420132012Wrote 6 papers:
- DATE-2015-BaranowskiFKLTW #online #predict
- On-line prediction of NBTI-induced aging rates (RB, FF, SK, CL, MBT, HJW), pp. 589–592.
- DAC-2014-KiamehrOTN #analysis #approach #fault
- Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach (SK, THO, MBT, SRN), p. 6.
- DATE-2014-KiamehrFET #design #library #standard
- Aging-aware standard cell library design (SK, FF, ME, MBT), pp. 1–4.
- DATE-2013-FirouziKTN #analysis #runtime
- Incorporating the impacts of workload-dependent runtime variations into timing analysis (FF, SK, MBT, SRN), pp. 1022–1025.
- DATE-2013-Hara-AzumiFKT #process
- Instruction-set extension under process variation and aging effects (YHA, FF, SK, MBT), pp. 182–187.
- DATE-2012-FirouziKT
- NBTI mitigation by optimized NOP assignment and insertion (FF, SK, MBT), pp. 218–223.