A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations
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Wujie Wen, Mengjie Mao, Hai Li 0001, Yiran Chen, Yukui Pei, Ning Ge 0001
A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-WenMLCPG,
	author        = "Wujie Wen and Mengjie Mao and Hai Li 0001 and Yiran Chen and Yukui Pei and Ning Ge 0001",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459508/",
	isbn          = "978-3-9815-3707-9",
	pages         = "1285--1290",
	publisher     = "{IEEE}",
	title         = "{A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations}",
	year          = 2016,
}


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