Wujie Wen, Mengjie Mao, Hai Li 0001, Yiran Chen, Yukui Pei, Ning Ge 0001
A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations
DATE, 2016.
@inproceedings{DATE-2016-WenMLCPG,
author = "Wujie Wen and Mengjie Mao and Hai Li 0001 and Yiran Chen and Yukui Pei and Ning Ge 0001",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459508/",
isbn = "978-3-9815-3707-9",
pages = "1285--1290",
publisher = "{IEEE}",
title = "{A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations}",
year = 2016,
}