Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors
DATE, 2019.
@inproceedings{DATE-2019-FengVJRV,
author = "Keven Feng and Sandeep Vora and Rui Jiang and Elyse Rosenbaum and Shobha Vasudevan",
booktitle = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2019.8715149",
isbn = "978-3-9819263-2-3",
pages = "156--161",
publisher = "{IEEE}",
title = "{Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors}",
year = 2019,
}