@inproceedings{DATE-2019-Liu0ZWLLX,
	author        = "Weihua Liu and Fei Wu 0005 and Meng Zhang 0014 and Yifei Wang and Zhonghai Lu and Xiangfeng Lu and Changsheng Xie",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8714941",
	isbn          = "978-3-9819263-2-3",
	pages         = "312--315",
	publisher     = "{IEEE}",
	title         = "{Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash}",
	year          = 2019,
}