@inproceedings{DATE-2019-Saraza-Canflanca,
	author        = "Pablo Saraza-Canflanca and Javier Diaz-Fortuny and Rafael Castro-López and Elisenda Roca Moreno and Javier Martín-Martínez and Rosana Rodríguez and Montserrat Nafría and Francisco V. Fernández",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8715029",
	isbn          = "978-3-9819263-2-3",
	pages         = "150--155",
	publisher     = "{IEEE}",
	title         = "{New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors}",
	year          = 2019,
}