V. Kaal, Hans G. Kerkhoff
Compact structural test generation for analog macros
DATE, 1997.
@inproceedings{EDTC-1997-KaalK,
author = "V. Kaal and Hans G. Kerkhoff",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582420",
pages = "581--587",
publisher = "{IEEE}",
title = "{Compact structural test generation for analog macros}",
year = 1997,
}











