Compact structural test generation for analog macros
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V. Kaal, Hans G. Kerkhoff
Compact structural test generation for analog macros
DATE, 1997.

EDTC 1997
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@inproceedings{EDTC-1997-KaalK,
	author        = "V. Kaal and Hans G. Kerkhoff",
	booktitle     = "{Proceedings of the Second European Design and Test Conference}",
	doi           = "10.1109/EDTC.1997.582420",
	pages         = "581--587",
	publisher     = "{IEEE}",
	title         = "{Compact structural test generation for analog macros}",
	year          = 1997,
}

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