V. Kaal, Hans G. Kerkhoff
Compact structural test generation for analog macros
DATE, 1997.
@inproceedings{EDTC-1997-KaalK, author = "V. Kaal and Hans G. Kerkhoff", booktitle = "{Proceedings of the Second European Design and Test Conference}", doi = "10.1109/EDTC.1997.582420", pages = "581--587", publisher = "{IEEE}", title = "{Compact structural test generation for analog macros}", year = 1997, }