Travelled to:2 × France
3 × Germany
Collaborated with:J.Wan R.J.W.T.Tangelder V.Kaal V.A.Zivkovic G.Diemel S.Krishnan K.D.Doornbos R.Brand
Talks about:instrument (2) embed (2) test (2) architectur (1) transport (1) structur (1) scenario (1) electron (1) diagnosi (1) bayesian (1)
Person: Hans G. Kerkhoff
DBLP: Kerkhoff:Hans_G=
Contributed to:
20142012201020001997Wrote 6 papers:
- DATE-2014-WanK #embedded
- An embedded offset and gain instrument for OpAmp IPs (JW, HGK), pp. 1–4.
- DATE-2012-WanK #embedded #monitoring
- Monitoring active filters under automotive aging scenarios with embedded instrument (JW, HGK), pp. 1096–1101.
- DATE-2010-KrishnanDBK
- Block-level bayesian diagnosis of analogue electronic circuits (SK, KDD, RB, HGK), pp. 1767–1772.
- DATE-2000-ZivkovicTK #architecture #design
- Design and Test Space Exploration of Transport-Triggered Architectures (VAZ, RJWTT, HGK), pp. 146–151.
- EDTC-1997-KaalK #generative #metaprogramming #testing
- Compact structural test generation for analog macros (VK, HGK), pp. 581–587.
- EDTC-1997-TangelderDK
- Smart sensor system application: an integrated compass (RJWTT, GD, HGK), pp. 195–199.