S. Özdemir, Alper Baykut, Rusen Meylani, Aytül Erçil, Aysin Ertüzün
Comparative evaluation of texture analysis algorithms for defect inspection of textile products
ICPR, 1998.
@inproceedings{ICPR-1998-OzdemirBMEE,
author = "S. Özdemir and Alper Baykut and Rusen Meylani and Aytül Erçil and Aysin Ertüzün",
booktitle = "{Proceedings of the 14th International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.1998.712061",
isbn = "0-8186-8512-3",
pages = "1738--1740",
publisher = "{IEEE Computer Society}",
title = "{Comparative evaluation of texture analysis algorithms for defect inspection of textile products}",
year = 1998,
}











