Comparative evaluation of texture analysis algorithms for defect inspection of textile products
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S. Özdemir, Alper Baykut, Rusen Meylani, Aytül Erçil, Aysin Ertüzün
Comparative evaluation of texture analysis algorithms for defect inspection of textile products
ICPR, 1998.

ICPR 1998
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@inproceedings{ICPR-1998-OzdemirBMEE,
	author        = "S. Özdemir and Alper Baykut and Rusen Meylani and Aytül Erçil and Aysin Ertüzün",
	booktitle     = "{Proceedings of the 14th International Conference on Pattern Recognition}",
	doi           = "10.1109/ICPR.1998.712061",
	isbn          = "0-8186-8512-3",
	pages         = "1738--1740",
	publisher     = "{IEEE Computer Society}",
	title         = "{Comparative evaluation of texture analysis algorithms for defect inspection of textile products}",
	year          = 1998,
}

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