S. Özdemir, Alper Baykut, Rusen Meylani, Aytül Erçil, Aysin Ertüzün
Comparative evaluation of texture analysis algorithms for defect inspection of textile products
ICPR, 1998.
@inproceedings{ICPR-1998-OzdemirBMEE, author = "S. Özdemir and Alper Baykut and Rusen Meylani and Aytül Erçil and Aysin Ertüzün", booktitle = "{Proceedings of the 14th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.1998.712061", isbn = "0-8186-8512-3", pages = "1738--1740", publisher = "{IEEE Computer Society}", title = "{Comparative evaluation of texture analysis algorithms for defect inspection of textile products}", year = 1998, }