A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces
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Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces
ICPR, 2010.

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@inproceedings{ICPR-2010-ChaoTLC,
	author        = "Shin-Min Chao and Du-Ming Tsai and Wei-Chen Li and Wei-Yao Chiu",
	booktitle     = "{Proceedings of the 20th International Conference on Pattern Recognition}",
	doi           = "10.1109/ICPR.2010.1071",
	isbn          = "978-0-7695-4109-9",
	pages         = "4408--4411",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces}",
	year          = 2010,
}

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