Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces
ICPR, 2010.
@inproceedings{ICPR-2010-ChaoTLC, author = "Shin-Min Chao and Du-Ming Tsai and Wei-Chen Li and Wei-Yao Chiu", booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.2010.1071", isbn = "978-0-7695-4109-9", pages = "4408--4411", publisher = "{IEEE Computer Society}", title = "{A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces}", year = 2010, }