Fabian Timm, Thomas Martinetz
Statistical Fourier Descriptors for Defect Image Classification
ICPR, 2010.
@inproceedings{ICPR-2010-TimmM, author = "Fabian Timm and Thomas Martinetz", booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.2010.1018", isbn = "978-0-7695-4109-9", pages = "4190--4193", publisher = "{IEEE Computer Society}", title = "{Statistical Fourier Descriptors for Defect Image Classification}", year = 2010, }