Statistical Fourier Descriptors for Defect Image Classification
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Fabian Timm, Thomas Martinetz
Statistical Fourier Descriptors for Defect Image Classification
ICPR, 2010.

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@inproceedings{ICPR-2010-TimmM,
	author        = "Fabian Timm and Thomas Martinetz",
	booktitle     = "{Proceedings of the 20th International Conference on Pattern Recognition}",
	doi           = "10.1109/ICPR.2010.1018",
	isbn          = "978-0-7695-4109-9",
	pages         = "4190--4193",
	publisher     = "{IEEE Computer Society}",
	title         = "{Statistical Fourier Descriptors for Defect Image Classification}",
	year          = 2010,
}

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