Minimum Enclosing and Maximum Excluding Machine for Pattern Description and Discrimination
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Yi Liu, Yuan F. Zheng
Minimum Enclosing and Maximum Excluding Machine for Pattern Description and Discrimination
ICPR, 2006.

ICPR v3 2006
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@inproceedings{ICPR-v3-2006-LiuZ,
	author        = "Yi Liu and Yuan F. Zheng",
	booktitle     = "{Proceedings of the 18th International Conference on Pattern Recognition, Volume 3}",
	doi           = "10.1109/ICPR.2006.799",
	isbn          = "0-7695-2521-0",
	pages         = "129--132",
	publisher     = "{IEEE Computer Society}",
	title         = "{Minimum Enclosing and Maximum Excluding Machine for Pattern Description and Discrimination}",
	year          = 2006,
}


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