Mike Papadakis, Donghwan Shin 0001, Shin Yoo, Doo-Hwan Bae
Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults
ICSE, 2018.
@inproceedings{ICSE-2018-PapadakisSYB,
author = "Mike Papadakis and Donghwan Shin 0001 and Shin Yoo and Doo-Hwan Bae",
booktitle = "{Proceedings of the 40th International Conference on Software Engineering}",
doi = "10.1145/3180155.3180183",
ee = "http://ieeexplore.ieee.org/document/8453121",
isbn = "978-1-4503-5638-1",
pages = "537--548",
publisher = "{ACM}",
title = "{Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults}",
year = 2018,
}
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