Test Instrumentation and Pattern Matching for Automatic Failure Identification
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Dan Travison, Geoff Staneff
Test Instrumentation and Pattern Matching for Automatic Failure Identification
ICST, 2008.

ICST 2008
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@inproceedings{ICST-2008-TravisonS,
	author        = "Dan Travison and Geoff Staneff",
	booktitle     = "{Proceedings of the First International Conference on Software Testing, Verification and Validation}",
	doi           = "10.1109/ICST.2008.69",
	isbn          = "978-0-7695-3127-4",
	pages         = "377--386",
	publisher     = "{IEEE Computer Society}",
	title         = "{Test Instrumentation and Pattern Matching for Automatic Failure Identification}",
	year          = 2008,
}

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