Travelled to:
1 × Norway
Collaborated with:
D.Travison
Talks about:
instrument (1) pattern (1) identif (1) automat (1) failur (1) match (1) test (1)
Person: Geoff Staneff
DBLP: Staneff:Geoff
Contributed to:
Wrote 1 papers:
- ICST-2008-TravisonS #automation #identification #pattern matching
- Test Instrumentation and Pattern Matching for Automatic Failure Identification (DT, GS), pp. 377–386.