Metric forensics: a multi-level approach for mining volatile graphs
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Keith Henderson, Tina Eliassi-Rad, Christos Faloutsos, Leman Akoglu, Lei Li, Koji Maruhashi, B. Aditya Prakash, Hanghang Tong
Metric forensics: a multi-level approach for mining volatile graphs
KDD, 2010.

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@inproceedings{KDD-2010-HendersonEFALMPT,
	author        = "Keith Henderson and Tina Eliassi-Rad and Christos Faloutsos and Leman Akoglu and Lei Li and Koji Maruhashi and B. Aditya Prakash and Hanghang Tong",
	booktitle     = "{Proceedings of the 16th International Conference on Knowledge Discovery and Data Mining}",
	doi           = "10.1145/1835804.1835828",
	isbn          = "978-1-4503-0055-1",
	pages         = "163--172",
	publisher     = "{ACM}",
	title         = "{Metric forensics: a multi-level approach for mining volatile graphs}",
	year          = 2010,
}

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