Rebekka Alm, Sven Kiehl, Birger Lantow, Kurt Sandkuhl
Applicability of Quality Metrics for Ontologies on Ontology Design Patterns
KEOD, 2013.
@inproceedings{KEOD-2013-AlmKLS, author = "Rebekka Alm and Sven Kiehl and Birger Lantow and Kurt Sandkuhl", booktitle = "{Proceedings of the Fifth International Conference on Knowledge Engineering and Ontology Development}", doi = "10.5220/0004541400480057", isbn = "978-989-8565-81-5", pages = "48--57", publisher = "{SciTePress}", title = "{Applicability of Quality Metrics for Ontologies on Ontology Design Patterns}", year = 2013, }