Travelled to:1 × Portugal
1 × USA
Collaborated with:M.Aehnelt S.Hadlak B.Urban S.Kiehl B.Lantow K.Sandkuhl
Talks about:ontolog (3) manufactur (1) heterogen (1) qualiti (1) pattern (1) visual (1) metric (1) domain (1) design (1) applic (1)
Person: Rebekka Alm
DBLP: Alm:Rebekka
Contributed to:
2015
2013Wrote 2 papers:
- HIMI-IKD-2015-AlmAHU #ontology #visualisation
- Annotated Domain Ontologies for the Visualization of Heterogeneous Manufacturing Data (RA, MA, SH, BU), pp. 3–14.
- KEOD-2013-AlmKLS #design pattern #metric #ontology #quality
- Applicability of Quality Metrics for Ontologies on Ontology Design Patterns (RA, SK, BL, KS), pp. 48–57.