Travelled to:
1 × Portugal
Collaborated with:
R.Alm B.Lantow K.Sandkuhl
Talks about:
ontolog (2) qualiti (1) pattern (1) metric (1) design (1) applic (1)
Person: Sven Kiehl
DBLP: Kiehl:Sven
Contributed to:
Wrote 1 papers:
- KEOD-2013-AlmKLS #design pattern #metric #ontology #quality
- Applicability of Quality Metrics for Ontologies on Ontology Design Patterns (RA, SK, BL, KS), pp. 48–57.