Sorin Lerner, Atanas Rountev
Proceedings of the Ninth Workshop on Program Analysis for Software Tools and Engineering
PASTE, 2010.
@proceedings{PASTE-2010,
acmid = "1806672",
address = "Toronto, Ontario, Canada",
editor = "Sorin Lerner and Atanas Rountev",
isbn = "978-1-4503-0082-7",
publisher = "{ACM}",
title = "{Proceedings of the Ninth Workshop on Program Analysis for Software Tools and Engineering}",
year = 2010,
}
Contents (12 items)
- PASTE-2010-FlanaganF #concurrent #dynamic analysis #framework #source code
- The RoadRunner dynamic analysis framework for concurrent programs (CF, SNF), pp. 1–8.
- PASTE-2010-ReissK #thread #transaction #visualisation
- Visualizing threads, transactions and tasks (SPR, SK), pp. 9–16.
- PASTE-2010-HaC #communication #concurrent #dynamic analysis
- Opportunities for concurrent dynamic analysis with explicit inter-core communication (JH, SPC), pp. 17–20.
- PASTE-2010-RosenblumMZ #compilation
- Extracting compiler provenance from program binaries (NER, BPM, XZ), pp. 21–28.
- PASTE-2010-MizushimaMY #constant #parsing
- Packrat parsers can handle practical grammars in mostly constant space (KM, AM, YY), pp. 29–36.
- PASTE-2010-CalmanZ #analysis #induction #information retrieval #interprocedural
- Interprocedural induction variable analysis based on interprocedural SSA form IR (SC, JZ), pp. 37–44.
- PASTE-2010-NarayanappaBR
- Property-aware program sampling (HN, MSB, HR), pp. 45–52.
- PASTE-2010-IslamKBH #clustering #dependence
- Coherent dependence clusters (SSI, JK, DB, MH), pp. 53–60.
- PASTE-2010-Schmeelk #benchmark #detection #metric #towards
- Towards a unified fault-detection benchmark (SS), pp. 61–64.
- PASTE-2010-AyewahP #analysis #null
- Null dereference analysis in practice (NA, WP), pp. 65–72.
- PASTE-2010-Rubio-GonzalezL #documentation #fault
- Expect the unexpected: error code mismatches between documentation and the real world (CRG, BL), pp. 73–80.
- PASTE-2010-FengG #fault #learning #locality #modelling #probability
- Learning universal probabilistic models for fault localization (MF, RG), pp. 81–88.