Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero
An evolutionary algorithm for reducing integrated-circuit test application time
SAC, 2002.
@inproceedings{SAC-2002-CornoRS, author = "Fulvio Corno and Matteo Sonza Reorda and Giovanni Squillero", booktitle = "{Proceedings of the 17th Symposium on Applied Computing}", doi = "10.1145/508791.508908", pages = "608--612", publisher = "{ACM}", title = "{An evolutionary algorithm for reducing integrated-circuit test application time}", year = 2002, }