BibSLEIGH — Matteo_Sonza

Travelled to:

1 × Italy
1 × Spain
10 × France
4 × USA
8 × Germany

Collaborated with:

F.Corno M.Rebaudengo G.Squillero M.Violante P.Bernardi P.Prinetto S.Gai L.Sterpone D.Sabena E.Sánchez G.Cumani M.Schillaci G.Cabodi P.Camurati A.Riefert M.Sauer B.Becker L.Carro O.Goloubeva P.L.Montessoro C.Meinhardt R.Reis G.Masera F.Quaglio F.L.Kastensmidt M.Torchiano S.Chiusano M.Gilli R.Cantoro R.Aitken G.Fey Z.T.Kalbarczyk F.Reichenbach M.Bonazza O.Ballan A.Manzone A.Pincetti M.Lajolo L.Lavagno A.Benso R.Ubar L.M.Ciganda P.Cheynet B.Nicolescu R.Velazco E.M.Rudnick R.Vietti A.Ellis A.Touati A.Bosio L.Dilillo P.Girard A.Virazel L.Berrojo I.González L.Entrena C.López L.A.Bautista-Gomez F.Cappello N.DeBardeleben B.Fang S.Gurumurthi K.Pattabiraman P.Rech M.Bellato D.Bortolato A.Candelori M.Ceschia A.Paccagnella P.Zambolin

Talks about:

test (19) generat (10) processor (8) circuit (8) automat (8) algorithm (7) techniqu (7) effect (7) new (7) sequenti (6)

Person: Matteo Sonza Reorda

DBLP: Reorda:Matteo_Sonza

Contributed to:

2015

2014

2013

2012

2009

2008

2007

2006

2004

2005

2004

2003

2002

2001

2000

1999

1998

1997

1995

1994

1993

1992

1990

Wrote 42 papers:

DATE-2015-RiefertCSRB #automation #generative #on the #source code: On the automatic generation of SBST test programs for in-field test (AR, RC, MS, MSR, BB), pp. 1186–1191.
DATE-2015-TouatiBDGVBR #functional #power management #source code #testing: Exploring the impact of functional test programs re-used for power-aware testing (AT, AB, LD, PG, AV, PB, MSR), pp. 1277–1280.
DATE-2014-Bautista-GomezCCDFGPRR #how #named #reliability: GPGPUs: How to combine high computational power with high reliability (LABG, FC, LC, ND, BF, SG, KP, PR, MSR), pp. 1–9.
DATE-2014-RiefertCSBRB #approach #automation #effectiveness #fault #functional #generative #testing: An effective approach to automatic functional processor test generation for small-delay faults (AR, LMC, MS, PB, MSR, BB), pp. 1–6.
DATE-2013-AitkenFKRR #analysis #how #question #reliability: Reliability analysis reloaded: how will we survive? (RA, GF, ZTK, FR, MSR), pp. 358–367.
DATE-2013-BernardiBSRB #embedded #fault #identification #online: On-line functionally untestable fault identification in embedded processor cores (PB, MB, ES, MSR, OB), pp. 1462–1467.
DATE-2012-SabenaRS #algorithm #testing: A new SBST algorithm for testing the register file of VLIW processors (DS, MSR, LS), pp. 412–417.
PDP-2012-SterponeSR #approach #fault #injection #testing: A New Fault Injection Approach for Testing Network-on-Chips (LS, DS, MSR), pp. 530–535.
DATE-2009-ReordaVMR #embedded #low cost: A low-cost SEE mitigation solution for soft-processors embedded in Systems on Pogrammable Chips (MSR, MV, CM, RR), pp. 352–357.
DATE-2008-BernardiR #novel #testing: An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers (PB, MSR), pp. 194–199.
DATE-2007-SanchezSSR #automation #effectiveness #generative #interactive #source code: Interactive presentation: An enhanced technique for the automatic generation of effective diagnosis-oriented test programs for processor (ES, MS, GS, MSR), pp. 1158–1163.
DATE-2006-BernardiSSSR #cost analysis #effectiveness: An effective technique for minimizing the cost of processor software-based diagnosis in SoCs (PB, ES, MS, GS, MSR), pp. 412–417.
DATE-2005-BernardiMQR04 #approach #logic #testing #using: Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study (PB, GM, FQ, MSR), pp. 228–233.
DATE-2005-KastensmidtSCR #composition #design #logic #on the: On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs (FLK, LS, LC, MSR), pp. 1290–1295.
DATE-v1-2004-BellatoBBCCPRRVZ #memory management: Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA (MB, PB, DB, AC, MC, AP, MR, MSR, MV, PZ), pp. 584–589.
DATE-v1-2004-GoloubevaRV #automation #generative #validation: Automatic Generation of Validation Stimuli for Application-Specific Processors (OG, MSR, MV), pp. 188–193.
DATE-2003-BernardiRRV #approach #embedded #programmable: A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories (PB, MR, MSR, MV), pp. 10720–10725.
DATE-2003-CornoCRS #automation #generative: Fully Automatic Test Program Generation for Microprocessor Cores (FC, GC, MSR, GS), pp. 11006–11011.
DATE-2003-RebaudengoRV #analysis #fault #pipes and filters: An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor (MR, MSR, MV), pp. 10602–10607.
SAC-2003-CornoCRS #automation #generative #pipes and filters: Automatic Test Program Generation for Pipeline Processors (FC, GC, MSR, GS), pp. 736–740.
DATE-2002-BerrojoGCRSEL #injection: New Techniques for Speeding-Up Fault-Injection Campaigns (LB, IG, FC, MSR, GS, LE, CL), pp. 847–852.
SAC-2002-CornoRS #algorithm: An evolutionary algorithm for reducing integrated-circuit test application time (FC, MSR, GS), pp. 608–612.
DATE-2001-CheynetNVRRV #automation #evaluation #program transformation #safety: System safety through automatic high-level code transformations: an experimental evaluation (PC, BN, RV, MR, MSR, MV), pp. 297–301.
DATE-2001-CornoRSV #on the: On the test of microprocessor IP cores (FC, MSR, GS, MV), pp. 209–213.
SAC-2001-CornoRS #architecture #effectiveness #evolution: Evolving effective CA/CSTP: BIST architectures for sequential circuits (FC, MSR, GS), pp. 345–350.
SCAM-2001-RebaudengoRVT #compilation #generative #text-to-text: A Source-to-Source Compiler for Generating Dependable Software (MR, MSR, MV, MT), pp. 35–44.
DATE-2000-CornoRSMP #automation #experience #generative #industrial #validation: Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience (FC, MSR, GS, AM, AP), pp. 385–389.
DATE-2000-LajoloRRVL #co-evolution #dependence #design #framework: Evaluating System Dependability in a Co-Design Framework (ML, MR, MSR, MV, LL), pp. 586–590.
DATE-1999-CornoRS #algorithm #approximate #equivalence #search-based #verification: Approximate Equivalence Verification of Sequential Circuits via Genetic Algorithms (FC, MSR, GS), pp. 754–755.
DATE-1998-CornoPRV: Exploiting Symbolic Techniques for Partial Scan Flip Flop Selection (FC, PP, MSR, MV), pp. 670–677.
DATE-1998-RudnickVECPR #generative #performance #testing #using: Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques (EMR, RV, AE, FC, PP, MSR), pp. 570–576.
SAC-1998-CornoRS #algorithm #optimisation: The selfish gene algorithm: a new evolutionary optimization strategy (FC, MSR, GS), pp. 349–355.
EDTC-1997-BensoPRRU #approach #fault #graph #low level: A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs (AB, PP, MR, MSR, RU), pp. 560–565.
EDTC-1997-ChiusanoCPR #graph #hybrid #problem: Hybrid symbolic-explicit techniques for the graph coloring problem (SC, FC, PP, MSR), pp. 422–426.
EDTC-1997-CornoPRR #sequence #testing: New static compaction techniques of test sequences for sequential circuits (FC, PP, MR, MSR), pp. 37–43.
SAC-1997-CornoPRR #algorithm #generative #named: SAARA: a simulated annealing algorithm for test pattern generation for digital circuits (FC, PP, MR, MSR), pp. 228–232.
PDP-1995-GaiRR #algorithm #parallel #using: An improved data parallel algorithm for Boolean function manipulation using BDDs (SG, MR, MSR), pp. 33–41.
EDAC-1994-GaiMR #fault #named #performance: TORSIM: An Efficient Fault Simulator for Synchronous Sequential Circuits (SG, PLM, MSR), pp. 46–50.
PDP-1994-CabodiGRR #architecture #parallel: A BDD Package For A Massively Parallel SIMD Architecture (GC, SG, MR, MSR), pp. 212–219.
PDP-1993-RebaudengoR #algorithm #analysis #migration #parallel #search-based: An experimental analysis of the effects of migration in parallel genetic algorithms (MR, MSR), pp. 232–238.
DAC-1992-CabodiCCGPR #traversal: A New Model for Improving symbolic Product Machine Traversal (GC, PC, FC, SG, PP, MSR), pp. 614–619.
CAV-1990-CamuratiGPR #model checking #using: The Use of Model Checking in ATPG for Sequential Circuits (PC, MG, PP, MSR), pp. 86–95.