BibSLEIGH — Fulvio

Travelled to:

1 × Cyprus
1 × Spain
3 × Germany
4 × USA
6 × France

Collaborated with:

M.S.Reorda G.Squillero P.Prinetto D.Bonino G.Cumani M.Violante M.Rebaudengo S.Chiusano P.Camurati L.Entrena P.Pellegrino F.Pescarmona L.Farinetti A.Ferrato A.Manzone A.Pincetti E.S.Millán J.A.Espejo C.Bayol B.Soulas E.M.Rudnick R.Vietti A.Ellis G.Cabodi S.Gai L.Berrojo I.González C.López

Talks about:

test (8) techniqu (6) circuit (6) sequenti (5) generat (5) algorithm (4) automat (4) symbol (4) level (4) new (4)

Person: Fulvio Corno

DBLP: Corno:Fulvio

Contributed to:

2006

2005

2004

2003

2002

2001

2000

1999

1998

1997

1994

1992

Wrote 20 papers:

SAC-2006-PellegrinoBC: Domotic house gateway (PP, DB, FC), pp. 1915–1920.
SAC-2005-BoninoCP #automation #concept #learning #network: Automatic learning of text-to-concept mappings exploiting WordNet-like lexical networks (DB, FC, FP), pp. 1639–1644.
SAC-2004-BoninoCFF #framework #multi #platform #semantics: Multilingual semantic elaboration in the DOSE platform (DB, FC, LF, AF), pp. 1642–1646.
DATE-2003-CornoCRS #automation #generative: Fully Automatic Test Program Generation for Microprocessor Cores (FC, GC, MSR, GS), pp. 11006–11011.
SAC-2003-CornoCRS #automation #generative #pipes and filters: Automatic Test Program Generation for Pipeline Processors (FC, GC, MSR, GS), pp. 736–740.
DATE-2002-BerrojoGCRSEL #injection: New Techniques for Speeding-Up Fault-Injection Campaigns (LB, IG, FC, MSR, GS, LE, CL), pp. 847–852.
SAC-2002-CornoRS #algorithm: An evolutionary algorithm for reducing integrated-circuit test application time (FC, MSR, GS), pp. 608–612.
DATE-2001-CornoRSV #on the: On the test of microprocessor IP cores (FC, MSR, GS, MV), pp. 209–213.
SAC-2001-CornoRS #architecture #effectiveness #evolution: Evolving effective CA/CSTP: BIST architectures for sequential circuits (FC, MSR, GS), pp. 345–350.
DATE-2000-CornoRSMP #automation #experience #generative #industrial #validation: Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience (FC, MSR, GS, AM, AP), pp. 385–389.
DATE-1999-CornoRS #algorithm #approximate #equivalence #search-based #verification: Approximate Equivalence Verification of Sequential Circuits via Genetic Algorithms (FC, MSR, GS), pp. 754–755.
DATE-1999-MillanEECC #logic #optimisation: Integrating Symbolic Techniques in ATPG-Based Sequential Logic Optimization (ESM, LE, JAE, SC, FC), pp. 516–520.
DATE-1998-CornoPRV: Exploiting Symbolic Techniques for Partial Scan Flip Flop Selection (FC, PP, MSR, MV), pp. 670–677.
DATE-1998-RudnickVECPR #generative #performance #testing #using: Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques (EMR, RV, AE, FC, PP, MSR), pp. 570–576.
SAC-1998-CornoRS #algorithm #optimisation: The selfish gene algorithm: a new evolutionary optimization strategy (FC, MSR, GS), pp. 349–355.
EDTC-1997-ChiusanoCPR #graph #hybrid #problem: Hybrid symbolic-explicit techniques for the graph coloring problem (SC, FC, PP, MSR), pp. 422–426.
EDTC-1997-CornoPRR #sequence #testing: New static compaction techniques of test sequences for sequential circuits (FC, PP, MR, MSR), pp. 37–43.
SAC-1997-CornoPRR #algorithm #generative #named: SAARA: a simulated annealing algorithm for test pattern generation for digital circuits (FC, PP, MR, MSR), pp. 228–232.
EDAC-1994-CamuratiCPBS #design #modelling #verification: System-Level Modeling and Verification: a Comprehensive Design Methodology (PC, FC, PP, CB, BS), pp. 636–640.
DAC-1992-CabodiCCGPR #traversal: A New Model for Improving symbolic Product Machine Traversal (GC, PC, FC, SG, PP, MSR), pp. 614–619.