Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3
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Diana Vega, Ina Schieferdecker, George Din
Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3
FATES, 2007.

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@inproceedings{TestCom-FATES-2007-VegaSD,
	author        = "Diana Vega and Ina Schieferdecker and George Din",
	booktitle     = "{Proceedings of the 19th International Conference on Testing Software and Communicating Systems and Seventh International Workshop on Formal Approaches to Testing of Software}",
	doi           = "10.1007/978-3-540-73066-8_24",
	isbn          = "978-3-540-73065-1",
	pages         = "351--364",
	publisher     = "{Springer International Publishing}",
	series        = "{Lecture Notes in Computer Science}",
	title         = "{Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3}",
	volume        = 4581,
	year          = 2007,
}

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