Fehmi Jaafar, Yann-Gaël Guéhéneuc, Sylvie Hamel, Foutse Khomh
Mining the relationship between anti-patterns dependencies and fault-proneness
WCRE, 2013.
@inproceedings{WCRE-2013-JaafarGHK,
author = "Fehmi Jaafar and Yann-Gaël Guéhéneuc and Sylvie Hamel and Foutse Khomh",
booktitle = "{Proceedings of the 20th Working Conference on Reverse Engineering}",
doi = "10.1109/WCRE.2013.6671310",
editor = "Ralf Lämmel and Rocco Oliveto and Romain Robbes",
pages = "351--360",
publisher = "{IEEE}",
title = "{Mining the relationship between anti-patterns dependencies and fault-proneness}",
year = 2013,
}











