Travelled to:
1 × Hungary
Collaborated with:
C.Cifuentes N.Keynes L.Li N.Hawes M.Valdiviezo A.Browne J.Zimmermann A.Craik D.Teoh
Talks about:
parfait (1) system (1) static (1) applic (1) error (1) check (1) larg (1) deep (1) use (1)
Person: Christian Hoermann
DBLP: Hoermann:Christian
Contributed to:
Wrote 1 papers:
- ESEC-FSE-2011-CifuentesKLHVBZCTH #fault #scalability #using
- Static deep error checking in large system applications using parfait (CC, NK, LL, NH, MV, AB, JZ, AC, DT, CH), pp. 432–435.