Travelled to:
1 × USA
Collaborated with:
T.Ogihara K.Muroi S.Murai
Talks about:
scan (2) synchron (1) reliabl (1) partial (1) generat (1) circuit (1) system (1) effect (1) test (1) mult (1)
Person: Genichi Yonemori
DBLP: Yonemori:Genichi
Contributed to:
Wrote 1 papers:
- DAC-1989-OgiharaMYM #effectiveness #generative #named #reliability #testing
- MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits (TO, KM, GY, SM), pp. 519–524.