Travelled to:
1 × USA
Collaborated with:
T.Arima M.Tsuboya J.Okuda
Talks about:
algorithm (1) sequenti (1) heurist (1) generat (1) circuit (1) test (1) new (1)
Person: Goro Amamiya
DBLP: Amamiya:Goro
Contributed to:
Wrote 1 papers:
- DAC-1974-ArimaTAO #algorithm #generative #heuristic #testing
- A new heuristic test generation algorithm for sequential circuits (TA, MT, GA, JO), pp. 169–176.