Travelled to:
2 × USA
Collaborated with:
S.Funatsu N.Wakatsuki M.Tsuboya G.Amamiya J.Okuda
Talks about:
generat (2) test (2) algorithm (1) sequenti (1) heurist (1) circuit (1) system (1) japan (1) new (1)
Person: Toshihiro Arima
DBLP: Arima:Toshihiro
Contributed to:
Wrote 2 papers:
- DAC-1975-FunatsuWA #generative #testing
- Test generation systems in Japan (SF, NW, TA), pp. 114–122.
- DAC-1974-ArimaTAO #algorithm #generative #heuristic #testing
- A new heuristic test generation algorithm for sequential circuits (TA, MT, GA, JO), pp. 169–176.