Collaborated with:
Y.Yang Y.Zhou B.Xu J.Liu Y.Zhao L.X.0003 H.Leung Y.J.0001 Z.Z.0002 Y.Wang H.Sun
Talks about:
model (2) unsupervis (1) supervis (1) predict (1) coverag (1) automat (1) profil (1) effort (1) defect (1) better (1)
Person: Hongmin Lu
DBLP: Lu:Hongmin
Contributed to:
Wrote 2 papers:
- FSE-2016-YangZLZL0XL #fault #modelling #predict
- Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models (YY, YZ, JL, YZ, HL, LX0, BX, HL), pp. 157–168.
- ASE-2019-YangJ0WSLZX #automation #self #test coverage
- Automatic Self-Validation for Code Coverage Profilers (YY, YJ0, ZZ0, YW, HS, HL, YZ, BX), pp. 79–90.