Travelled to:1 × Canada
1 × Spain
Collaborated with:D.Kim S.Y.Bang H.Kim W.Lee C.Kim S.Pang H.Je
Talks about:use (2) recognit (1) support (1) reliabl (1) pattern (1) panoram (1) ensembl (1) classif (1) vector (1) stitch (1)
Person: Hyun-Chul Kim
DBLP: Kim:Hyun=Chul
Contributed to:
20022000Wrote 3 papers:
- ICPR-v2-2002-KimKB #recognition #using
- Face Recognition Using LDA Mixture Model (HCK, DK, SYB), pp. 486–489.
- ICPR-v2-2002-KimPJKB #classification #using
- Pattern Classification Using Support Vector Machine Ensemble (HCK, SP, HMJ, DK, SYB), pp. 160–163.
- ICPR-v1-2000-KimKLK #image #reliability
- Stitching Reliability for Estimating Camera Focal Length in Panoramic Image Mosaicing (HSK, HCK, WKL, CHK), pp. 1596–1599.