Travelled to:
1 × France
Collaborated with:
Q.Xie Y.Wang S.Nazarian M.Pedram
Talks about:
techniqu (1) multipl (1) circuit (1) voltag (1) reduct (1) length (1) leakag (1) deepli (1) scale (1) regim (1)
Person: Ji Li
DBLP: Li:Ji
Contributed to:
Wrote 1 papers:
- DATE-2015-LiXWNP #fine-grained #multi #power management #reduction #using
- Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique (JL, QX, YW, SN, MP), pp. 1579–1582.