Travelled to:
1 × United Kingdom
Collaborated with:
H.Jia Y.L.Murphey T.Chang
Talks about:
intellig (1) vision (1) system (1) surfac (1) detect (1) defect (1) time (1) real (1)
Person: Jianjun Shi
DBLP: Shi:Jianjun
Contributed to:
Wrote 1 papers:
- ICPR-v3-2004-JiaMSC #detection #fault #realtime
- An Intelligent Real-time Vision System for Surface Defect Detection (HJ, YLM, JS, TSC), pp. 239–242.