Travelled to:
1 × Germany
Collaborated with:
L.Abdallah H.D.Stratigopoulos S.Mir
Talks about:
circuit (1) sensor (1) intrus (1) built (1) true (1) test (1) non (1)
Person: Josep Altet
DBLP: Altet:Josep
Contributed to:
Wrote 1 papers:
- DATE-2012-AbdallahSMA #testing
- Testing RF circuits with true non-intrusive built-in sensors (LA, HGDS, SM, JA), pp. 1090–1095.