Travelled to:1 × Russia
Collaborated with:J.Tretmans J.Feenstra E.Brinksma A.Belinfante R.G.d.Vries N.Goga L.M.G.Feijs S.Mauw
Talks about:test (3) formal (2) autom (2) protocol (1) transit (1) generat (1) system (1) output (1) factor (1) experi (1)
Person: Lex Heerink
DBLP: Heerink:Lex
Contributed to:
200019991998Wrote 3 papers:
- TestCom-2000-HeerinkFT #automation #protocol #testing
- Formal Test Automation: The Conference Protocol with PHACT (LH, JF, JT), pp. 211–220.
- IWTCS-1999-BelinfanteFVTGFMH #automation #empirical #testing
- Formal Test Automation: A Simple Experiment (AB, JF, RGdV, JT, NG, LMGF, SM, LH), pp. 179–196.
- IWTCS-1998-BrinksmaHT #generative #multi #testing
- Factorized Test Generation for Multi-Input/Output Transition Systems (EB, LH, JT), pp. 67–82.