Travelled to:
1 × France
Collaborated with:
T.Das
Talks about:
analysi (2) circuitri (1) sensit (1) toler (1) front (1) fault (1) end (1)
Person: P. R. Mukund
DBLP: Mukund:P=_R=
Contributed to:
Wrote 1 papers:
- DATE-2007-DasM #analysis
- Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry (TD, PRM), pp. 1277–1282.